Optimization of Testing Conditions for Mixed Gas Corrosion Testing of Electrical Contacts.
نویسندگان
چکیده
منابع مشابه
Contaminants on Electrical Contacts Used in Semiconductor Device Testing
Electrical contacts used in semiconductor device testing are often deposited with a small pip of dark colour contaminants after being subjected to repeating cycles of impact loading. Samples of used electrical contacts are checked under SEM and EDX. It is discovered that the contaminants contain high percentage of tin elements. The reason as to why the contamination formed is investigated and i...
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 2000
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.49.1338